Methods and systems to improve pedestal temperature control

ABSTRACT

A semiconductor processing system may include a substrate pedestal. The system may also include at least one fluid channel having a delivery portion configured to deliver a temperature controlled fluid to the substrate pedestal, and having a return portion configured to return the temperature controlled fluid from the substrate pedestal. The system may also include a heater coupled with the delivery portion of the at least one fluid channel. The system may also include a temperature measurement device coupled with the return portion of the at least one fluid channel, and the temperature measurement device may be communicatively coupled with the heater.

TECHNICAL FIELD

The present technology relates to semiconductor processes and equipment. More specifically, the present technology relates to improving substrate and pedestal temperature control within a semiconductor processing environment.

BACKGROUND

Integrated circuits are made possible by processes which produce intricately patterned material layers on substrate surfaces. Producing patterned material on a substrate requires controlled methods for a variety of operations being performed. These operations may be performed under varying conditions within the same environment, which may produce additional heat loads and temperature effects on a substrate.

Additionally, from one chamber to the next, process uniformity may be required to produce matching components regardless of the intricate processes performed. These processes may include maintaining a substrate at a particular temperature, or within a specific temperature range, from one operation to the next, as well as between chambers.

Thus, there is a need for improved system components that can provide more precise temperature control during chamber operations as well as from one chamber to the next. These and other needs are addressed by the present technology.

SUMMARY

Methods and systems for improving process uniformity are described, and an exemplary semiconductor processing system may include a substrate pedestal. The system may also include at least one fluid channel having a delivery portion configured to deliver a temperature controlled fluid to the substrate pedestal, and having a return portion configured to return the temperature controlled fluid from the substrate pedestal. The system may also include a heater coupled with the delivery portion of the at least one fluid channel. The system may also include a temperature measurement device coupled with the return portion of the at least one fluid channel, and the temperature measurement device may be communicatively coupled with the heater.

The temperature measurement device may be coupled with the return portion of the at least one fluid channel to directly contact a fluid flowed through the at least one fluid channel. The temperature controlled fluid may include at least one of water, glycol, or a refrigerant, and in embodiments may include a mixture of water and ethylene glycol. The system may further include a cooling device coupled with the delivery portion and the return portion of the at least one fluid channel between the heater and the temperature measurement device. In embodiments, the cooling device may include a chiller or a heat exchanger. The system may include a flow controller coupled with the return portion of the at least one fluid channel. In embodiments, the system may be configured to maintain a temperature of the pedestal below about 100° C., and may further be configured to maintain a temperature variation of the pedestal below about 3° C. Additionally, the heater may be configured to have a response time per 1° C. of less than 5 seconds from receipt of a communication from the temperature measurement device.

Methods of controlling a semiconductor processing system pedestal temperature are also described, and may include delivering a temperature controlled fluid to a semiconductor processing system pedestal. The methods may include receiving the temperature controlled fluid from the semiconductor processing system pedestal, and also may include measuring the temperature of the received temperature controlled fluid. The methods may further include communicating the measured temperature to a first temperature control device, and adjusting the temperature of the temperature controlled fluid.

In embodiments, the delivering operation may utilize at least one fluid channel housing the temperature controlled fluid. The adjusting operation may have a precision of 0.5° C. or less in embodiments as well. The delivery may be performed by a second temperature control device in fluid communication with the first temperature control device. In embodiments, the first temperature control device and second temperature control device may be coupled in series to deliver the temperature controlled fluid. Also in embodiments, the first temperature control device may heat the temperature controlled fluid, and the second temperature control device may cool the temperature controlled fluid. The temperature of the temperature controlled fluid may set by operation of both the first temperature control device and the second temperature control device in embodiments, and the adjusting operation may be performed by the first temperature control device.

The present technology may also include a semiconductor processing substrate pedestal system, which may include a substrate support pedestal. The system may include a cooling apparatus, and may include at least one delivery fluid channel providing fluid communication between the cooling apparatus and the substrate support pedestal. The system may also include at least one return fluid channel providing fluid communication between the substrate support pedestal and the cooling apparatus. Embodiments may also include a heating apparatus coupled with the at least one delivery fluid channel, as well as a temperature measurement device coupled with the at least one return fluid channel. The temperature measurement device may be communicatively coupled with the heating apparatus. The system may also include a flow controller coupled with the at least one return fluid channel.

Such technology may provide numerous benefits over conventional systems and techniques. For example, the system may be able to account for environmental heat loads within the processing chamber. Additional advantages include that the system may provide improved chamber matching, as well as an ability to overcome lag time in heating designs of conventional systems. These and other embodiments, along with many of their advantages and features, are described in more detail in conjunction with the below description and attached figures.

BRIEF DESCRIPTION OF THE DRAWINGS

A further understanding of the nature and advantages of the disclosed technology may be realized by reference to the remaining portions of the specification and the drawings.

FIG. 1 shows a top plan view of one embodiment of an exemplary processing system.

FIG. 2A shows a schematic cross-sectional view of an exemplary processing chamber.

FIG. 2B shows a detailed view of a portion of the processing chamber illustrated in FIG. 2A.

FIG. 3 shows a bottom plan view of an exemplary showerhead according to the disclosed technology.

FIG. 4 shows a plan view of an exemplary faceplate according to the disclosed technology.

FIG. 5 shows a schematic cross-sectional view of a portion of the processing chamber illustrated in FIG. 2A according to embodiments of the disclosed technology.

FIG. 6 shows a flowchart of a method of controlling pedestal temperatures according to embodiments of the present technology.

Several of the figures are included as schematics. It is to be understood that the figures are for illustrative purposes, and are not to be considered of scale unless specifically stated to be as such.

In the appended figures, similar components and/or features may have the same reference label. Further, various components of the same type may be distinguished by following the reference label by a letter that distinguishes among the similar components. If only the first reference label is used in the specification, the description is applicable to any one of the similar components having the same first reference label irrespective of the letter.

DETAILED DESCRIPTION

The present technology includes systems and components for semiconductor processing. More specifically, the present technology provides a temperature control system via the substrate support pedestal that may maintain the pedestal at more uniform temperatures, and may be capable of faster reaction to changing system loads.

Many conventional chamber designs utilize temperature controlled fluids to modulate and maintain substrate temperatures, especially during cooling operations, although the technologies are applicable to heating substrates as well. However, precise temperature control may be difficult to achieve for a variety of reasons. For example, the chiller or heat exchanger utilized to chill a temperature controlled fluid may only have an accuracy of +/−1-5° C. if not worse. Accordingly, precise temperature control and adjustment may be difficult.

Additionally, many conventional systems monitor substrate temperature via a thermocouple attached to the substrate support pedestal. However, this can also produce issues both for chamber matching, as well as for accurate operation. For example, many thermocouples are based on resistance readings and are thus susceptible to discrepancy based on the particular contact with the support pedestal. For example, if the thermocouple is not in appropriate contact with the pedestal, poor readings may occur, producing temperature discrepancies. Although this can be corrected at the initial placement of the thermocouple by the manufacturer, when chamber cleaning operations or parts replacement occurs during which the thermocouple may be removed, the reassembly of the chamber provides a chance for improper contact and alignment of the thermocouple, which can produce inaccurate temperature readings. If a user has multiple chambers, this may also produce differences between the two chambers, which may ultimately produce variation in the end product. Moreover, for cooling operations, the temperature may be affected by the actual process itself. For example, a plasma may be formed or other components may be heated that will apply a heat load to the substrate and pedestal, and may alter the actual temperature being read or realized in the process.

Finally, by reading the temperature of the pedestal itself, a lag may occur between temperature readings and actual substrate temperatures. Many pedestal designs utilize a metal, ceramic, or combination pedestal that is heated or cooled conductively. By reading the temperature of the pedestal itself, when a change is needed, this is not detected until the temperature fluctuation proceeds through the pedestal material to the thermocouple. Depending on the thickness of the pedestal, the placement and contact of the thermocouple, and the amount of fluctuation of the process being performed, temperature drift of the substrate can occur, which can affect formation or removal processes being performed.

The present technology, however, may measure the fluid temperature exiting the pedestal, and provide feedback to a temperature control device connected with the delivery of the fluid. By measuring the exiting temperature, any temperature effect by the process itself can be measured, and by measuring the temperature of the fluid itself, any lag from conduction through a pedestal material can be avoided. Also by removing the measurement device from the pedestal itself, chamber cleaning operations or parts replacements are unlikely to affect the accuracy of the system, which may increase chamber matching across systems. Additionally, the use of an inline heater on the delivery may allow more precise temperature control of the delivered fluid. Finally, by communicatively coupling the measurement device and the inline heater, precise control can be afforded to reduce temperature drift of the substrate, and provide real-time feedback and control of the fluid temperature. These benefits and systems will be explained in more detail below.

Although the remaining disclosure will routinely identify specific etching processes utilizing the disclosed technology, it will be readily understood that the systems and methods are equally applicable to deposition and cleaning processes as may occur in the described chambers. Accordingly, the technology should not be considered to be so limited as for use with etching processes or chambers alone. Moreover, although an exemplary chamber is described to provide foundation for the present technology, it is to be understood that the present technology can be applied to virtually any semiconductor processing chamber.

FIG. 1 shows a top plan view of one embodiment of a processing system 100 of deposition, etching, baking, and curing chambers according to embodiments. In the figure, a pair of front opening unified pods (FOUPs) 102 supply substrates of a variety of sizes that are received by robotic arms 104 and placed into a low pressure holding area 106 before being placed into one of the substrate processing chambers 108 a-f, positioned in tandem sections 109 a-c. A second robotic arm 110 may be used to transport the substrate wafers from the holding area 106 to the substrate processing chambers 108 a-f and back. Each substrate processing chamber 108 a-f, can be outfitted to perform a number of substrate processing operations including the dry etch processes described herein in addition to cyclical layer deposition (CLD), atomic layer deposition (ALD), chemical vapor deposition (CVD), physical vapor deposition (PVD), etch, pre-clean, degas, orientation, and other substrate processes.

The substrate processing chambers 108 a-f may include one or more system components for depositing, annealing, curing and/or etching a dielectric film on the substrate wafer. In one configuration, two pairs of the processing chamber, e.g., 108 c-d and 108 e-f, may be used to deposit dielectric material on the substrate, and the third pair of processing chambers, e.g., 108 a-b, may be used to etch the deposited dielectric. In another configuration, all three pairs of chambers, e.g., 108 a-f, may be configured to etch a dielectric film on the substrate. Any one or more of the processes described may be carried out in chamber(s) separated from the fabrication system shown in different embodiments. It will be appreciated that additional configurations of deposition, etching, annealing, and curing chambers for dielectric films are contemplated by system 100.

FIG. 2A shows a cross-sectional view of an exemplary process chamber system 200 with partitioned plasma generation regions within the processing chamber. During film etching, e.g., titanium nitride, tantalum nitride, tungsten, silicon, polysilicon, silicon oxide, silicon nitride, silicon oxynitride, silicon oxycarbide, etc., a process gas may be flowed into the first plasma region 215 through a gas inlet assembly 205. A remote plasma system (RPS) 201 may optionally be included in the system, and may process a first gas which then travels through gas inlet assembly 205. The inlet assembly 205 may include two or more distinct gas supply channels where the second channel (not shown) may bypass the RPS 201, if included.

A cooling plate 203, faceplate 217, ion suppressor 223, showerhead 225, and a substrate support 265, having a substrate 255 disposed thereon, are shown and may each be included according to embodiments. The pedestal 265 may have a heat exchange channel through which a heat exchange fluid flows to control the temperature of the substrate, which may be operated to heat and/or cool the substrate or wafer during processing operations. The wafer support platter of the pedestal 265, which may comprise aluminum, ceramic, or a combination thereof, may also be resistively heated in order to achieve relatively high temperatures, such as from up to or about 100° C. to above or about 1100° C., using an embedded resistive heater element.

The faceplate 217 may be pyramidal, conical, or of another similar structure with a narrow top portion expanding to a wide bottom portion. The faceplate 217 may additionally be flat as shown and include a plurality of through-channels used to distribute process gases. Plasma generating gases and/or plasma excited species, depending on use of the RPS 201, may pass through a plurality of holes, shown in FIG. 2B, in faceplate 217 for a more uniform delivery into the first plasma region 215.

Exemplary configurations may include having the gas inlet assembly 205 open into a gas supply region 258 partitioned from the first plasma region 215 by faceplate 217 so that the gases/species flow through the holes in the faceplate 217 into the first plasma region 215. Structural and operational features may be selected to prevent significant backflow of plasma from the first plasma region 215 back into the supply region 258, gas inlet assembly 205, and fluid supply system 210. The faceplate 217, or a conductive top portion of the chamber, and showerhead 225 are shown with an insulating ring 220 located between the features, which allows an AC potential to be applied to the faceplate 217 relative to showerhead 225 and/or ion suppressor 223. The insulating ring 220 may be positioned between the faceplate 217 and the showerhead 225 and/or ion suppressor 223 enabling a capacitively coupled plasma (CCP) to be formed in the first plasma region. A baffle (not shown) may additionally be located in the first plasma region 215, or otherwise coupled with gas inlet assembly 205, to affect the flow of fluid into the region through gas inlet assembly 205.

The ion suppressor 223 may comprise a plate or other geometry that defines a plurality of apertures throughout the structure that are configured to suppress the migration of ionically-charged species out of the plasma excitation region 215 while allowing uncharged neutral or radical species to pass through the ion suppressor 223 into an activated gas delivery region between the suppressor and the showerhead. In embodiments, the ion suppressor 223 may comprise a perforated plate with a variety of aperture configurations. These uncharged species may include highly reactive species that are transported with less reactive carrier gas through the apertures. As noted above, the migration of ionic species through the holes may be reduced, and in some instances completely suppressed. Controlling the amount of ionic species passing through the ion suppressor 223 may advantageously provide increased control over the gas mixture brought into contact with the underlying wafer substrate, which in turn may increase control of the deposition and/or etch characteristics of the gas mixture. For example, adjustments in the ion concentration of the gas mixture can significantly alter its etch selectivity, e.g., SiNx:SiOx etch ratios, Si:SiOx etch ratios, etc. In alternative embodiments in which deposition is performed, it can also shift the balance of conformal-to-flowable style depositions for dielectric materials.

The plurality of apertures in the ion suppressor 223 may be configured to control the passage of the activated gas, i.e., the ionic, radical, and/or neutral species, through the ion suppressor 223. For example, the aspect ratio of the holes, or the hole diameter to length, and/or the geometry of the holes may be controlled so that the flow of ionically-charged species in the activated gas passing through the ion suppressor 223 is reduced. The holes in the ion suppressor 223 may include a tapered portion that faces the plasma excitation region 215, and a cylindrical portion that faces the showerhead 225. The cylindrical portion may be shaped and dimensioned to control the flow of ionic species passing to the showerhead 225. An adjustable electrical bias may also be applied to the ion suppressor 223 as an additional means to control the flow of ionic species through the suppressor.

The ion suppressor 223 may function to reduce or eliminate the amount of ionically charged species traveling from the plasma generation region to the substrate. Uncharged neutral and radical species may still pass through the openings in the ion suppressor to react with the substrate. It should be noted that the complete elimination of ionically charged species in the reaction region surrounding the substrate may not be performed in embodiments. In certain instances, ionic species are intended to reach the substrate in order to perform the etch and/or deposition process. In these instances, the ion suppressor may help to control the concentration of ionic species in the reaction region at a level that assists the process.

Showerhead 225 in combination with ion suppressor 223 may allow a plasma present in chamber plasma region 215 to avoid directly exciting gases in substrate processing region 233, while still allowing excited species to travel from chamber plasma region 215 into substrate processing region 233. In this way, the chamber may be configured to prevent the plasma from contacting a substrate 255 being etched. This may advantageously protect a variety of intricate structures and films patterned on the substrate, which may be damaged, dislocated, or otherwise warped if directly contacted by a generated plasma. Additionally, when plasma is allowed to contact the substrate or approach the substrate level, the rate at which oxide species etch may increase. Accordingly, if an exposed region of material is oxide, this material may be further protected by maintaining the plasma remotely from the substrate.

The processing system may further include a power supply 240 electrically coupled with the processing chamber to provide electric power to the faceplate 217, ion suppressor 223, showerhead 225, and/or pedestal 265 to generate a plasma in the first plasma region 215 or processing region 233. The power supply may be configured to deliver an adjustable amount of power to the chamber depending on the process performed. Such a configuration may allow for a tunable plasma to be used in the processes being performed. Unlike a remote plasma unit, which is often presented with on or off functionality, a tunable plasma may be configured to deliver a specific amount of power to the plasma region 215. This in turn may allow development of particular plasma characteristics such that precursors may be dissociated in specific ways to enhance the etching profiles produced by these precursors.

A plasma may be ignited either in chamber plasma region 215 above showerhead 225 or substrate processing region 233 below showerhead 225. Plasma may be present in chamber plasma region 215 to produce the radical precursors from an inflow of, for example, a fluorine-containing precursor or other precursor. An AC voltage typically in the radio frequency (RF) range may be applied between the conductive top portion of the processing chamber, such as faceplate 217, and showerhead 225 and/or ion suppressor 223 to ignite a plasma in chamber plasma region 215 during deposition. An RF power supply may generate a high RF frequency of 13.56 MHz but may also generate other frequencies alone or in combination with the 13.56 MHz frequency.

FIG. 2B shows a detailed view 253 of the features affecting the processing gas distribution through faceplate 217. As shown in FIGS. 2A and 2B, faceplate 217, cooling plate 203, and gas inlet assembly 205 intersect to define a gas supply region 258 into which process gases may be delivered from gas inlet 205. The gases may fill the gas supply region 258 and flow to first plasma region 215 through apertures 259 in faceplate 217. The apertures 259 may be configured to direct flow in a substantially unidirectional manner such that process gases may flow into processing region 233, but may be partially or fully prevented from backflow into the gas supply region 258 after traversing the faceplate 217.

The gas distribution assemblies such as showerhead 225 for use in the processing chamber section 200 may be referred to as dual channel showerheads (DCSH) and are additionally detailed in the embodiments described in FIG. 3 as well as FIG. 4 herein. The dual channel showerhead may provide for etching processes that allow for separation of etchants outside of the processing region 233 to provide limited interaction with chamber components and each other prior to being delivered into the processing region.

The showerhead 225 may comprise an upper plate 214 and a lower plate 216. The plates may be coupled with one another to define a volume 218 between the plates. The coupling of the plates may be so as to provide first fluid channels 219 through the upper and lower plates, and second fluid channels 221 through the lower plate 216. The formed channels may be configured to provide fluid access from the volume 218 through the lower plate 216 via second fluid channels 221 alone, and the first fluid channels 219 may be fluidly isolated from the volume 218 between the plates and the second fluid channels 221. The volume 218 may be fluidly accessible through a side of the gas distribution assembly 225.

FIG. 3 is a bottom view of a showerhead 325 for use with a processing chamber according to embodiments. Showerhead 325 corresponds with the showerhead shown in FIG. 2A. Through-holes 365, which show a view of first fluid channels 219, may have a plurality of shapes and configurations in order to control and affect the flow of precursors through the showerhead 225. Small holes 375, which show a view of second fluid channels 221, may be distributed substantially evenly over the surface of the showerhead, even amongst the through-holes 365, and may help to provide more even mixing of the precursors as they exit the showerhead than other configurations.

An arrangement for a faceplate according to embodiments is shown in FIG. 4. As shown, the faceplate 400 may comprise a perforated plate or manifold. The assembly of the faceplate may be similar to the showerhead as shown in FIG. 3, or may include a design configured specifically for distribution patterns of precursor gases. Faceplate 400 may include an annular frame 410 positioned in various arrangements within an exemplary processing chamber, such as the chamber as shown in FIG. 2. On or within the frame may be coupled a plate 420, which may be similar in embodiments to ion suppressor plate 223 as previously described. In embodiments faceplate 400 may be a single-piece design where the frame 410 and plate 420 are a single piece of material.

The plate may have a disc shape and be seated on or within the frame 410. The plate may be a conductive material such as a metal including aluminum, as well as other conductive materials that allow the plate to serve as an electrode for use in a plasma arrangement as previously described. The plate may be of a variety of thicknesses, and may include a plurality of apertures 465 defined within the plate. An exemplary arrangement as shown in FIG. 4 may include a pattern as previously described with reference to the arrangement in FIG. 3, and may include a series of rings of apertures in a geometric pattern, such as a hexagon as shown. As would be understood, the pattern illustrated is exemplary and it is to be understood that a variety of patterns, hole arrangements, and hole spacing are encompassed in the design.

The apertures 465 may be sized or otherwise configured to allow fluids to be flowed through the apertures during operation. The apertures may be sized less than about 2 inches in various embodiments, and may be less than or about 1.5 inches, about 1 inch, about 0.9 inches, about 0.8 inches, about 0.75 inches, about 0.7 inches, about 0.65 inches, about 0.6 inches, about 0.55 inches, about 0.5 inches, about 0.45 inches, about 0.4 inches, about 0.35 inches, about 0.3 inches, about 0.25 inches, about 0.2 inches, about 0.15 inches, about 0.1 inches, about 0.05 inches, etc. or less.

Turning to FIG. 5 is shown a sectional view of the pedestal in FIG. 2A, as well as a fluid delivery scheme according to the present technology. This sectional view shows a portion of a chamber or system 500 including a substrate pedestal 505, which may correspond to pedestal 265 of FIG. 2A. The system 500 may include a delivery channel or channels 510 a, which may be delivery portions of at least one fluid channel 510 about the system. The delivery portions 510 a may provide a temperature controlled fluid to the pedestal for temperature control of a substrate on which operations are occurring. The channels 510 may also include one or more return portions 510 b that provide a return path for the temperature controlled fluid from the substrate pedestal. It is to be understood that the schematic encompasses a variety of delivery and return configurations which may include a single or multiple channels that may distribute in different patterns within the pedestal, or may couple with multiple ports in the pedestal 505. The present technology is not to be considered limited to the single configuration illustrated, but may utilize any configuration that incorporates the components discussed further below. For example, a first fluid channel, such as a delivery channel, may provide fluid communication between a cooling apparatus and the substrate support pedestal, while a second fluid channel, such as a return fluid channel, may provide fluid communication between the substrate support pedestal and the cooling apparatus. A heating apparatus may then be incorporated with or coupled with the delivery fluid channel, and a temperature measurement device may be incorporated with or coupled with the return fluid channel. A flow controller may also be incorporated with or coupled with the at least one return fluid channel.

System 500 may also include a heater 515 coupled with the delivery portion 510 a of the fluid channel. The heater may be any number of applicable heaters that may be capable of heating the temperature control fluid being delivered to the substrate pedestal 505. The heater 515 may have a precision of better than +/−1° C., and may have a precision of better than +/−0.5° C., 0.3° C., 0.1° C., or better in disclosed embodiments. The heater may also have a fast response time from the time a signal is received to adjust the temperature. For example, the heater may have a response time per 1° C. of less than or about 10 seconds from receipt of a communication instructing a change in temperature. The response time may also be less than or about 8 seconds, less than or about 5 seconds, less than or about 4 seconds, less than or about 3 seconds, less than or about 2 seconds, less than or about 1 seconds, less than or about 0.5 seconds, etc. or less.

System 500 may also include a temperature measurement device 525 coupled with the return portion of the at least one fluid channel 510 b. The temperature measurement device 525 may also be communicatively coupled 527 with the heater 515 to provide temperature readings and adjustment information for controlling the temperature of the fluid delivered to the substrate pedestal. The temperature measurement device 525 may be a thermocouple or resistance temperature detector, as well as any other temperature sensing device. The temperature measurement device may be coupled with the return portion 510 b of the at least one fluid delivery channel, and may be coupled with the return portion to directly contact a fluid flowed through the at least one fluid channel, which may provide more accurate temperature reading. The temperature measurement device may have accuracy below 1° C., such as to about 0.1° C. The temperature reading may be delivered to the heater 515, which may include additional hardware or software (not shown) to compare the return temperature of a temperature controlled fluid to a set point to determine whether temperature adjustment utilizing heater 515 should Occur.

The fluid utilized within the system 500 may be any known temperature controllable fluid, which may include water, steam, refrigerant, glycol, or any other fluid capable of having its temperature adjusted. For example, many process operations require temperatures below about 100° C., or below room temperature, if not down to sub-zero temperatures, and thus may include temperatures below or about 80° C., 50° C., 40° C., 30° C., 20° C., 10° C., 0° C., −10° C., etc. or less, including any range produced between any two of these temperatures. This temperature may be for the temperature of the substrate or pedestal during any operation. For cooling operations, a temperature controlled fluid having a freezing point below the requisite temperature may be used, such as a refrigerant or a combination of water and glycol, such as ethylene glycol, in any ratio from about 0:1 to about 1:0, including a 1:1 ratio, for example.

System 500 may further include a cooling device 520 coupled with the delivery portion 510 a and return portion 510 b of the at least one fluid channel 510. The cooling device may be located between the heater and temperature measurement device within the loop, and may be on the same portion of the loop, or opposite portion of the loop as shown, from the substrate pedestal 505. The cooling device 520 may include a chiller, heat exchanger, or any other device capable of reducing the temperature of the temperature controlled fluid being flowed through the system. The cooling device 520 may be operated to singularly control the temperature of the temperature controlled fluid in embodiments, and may also work in conjunction or cooperation with the heater 515 to achieve a precise delivery temperature for the temperature controlled fluid. Such operation will be described in more detail below with regard to FIG. 6. In operation, the system may be configured to maintain a temperature variation of the pedestal during processing operations of below or about 5° C., such as below or about 4° C., 3° C., 2° C., 1° C., 0.7° C., 0.5° C., 0.3° C., 0.1° C., etc. or less.

System 500 may further include a flow controller 530 coupled with the system either in the delivery or return portion of the at least one fluid channel 510, such as in the return portion as illustrated in the Figure. The flow controller may include any number of valves, pumps, orifice plates, or other devices used to regulate flow within the system 500. The flow controller may also be utilized in conjunction with the heater 515 and cooling device 520 to regulate the temperature of the pedestal and substrate. For example, the flow may be increased or decreased to allow more or less temperature controlled fluid to be delivered to the pedestal based on heat transfer that may be occurring based on processing conditions. Although the flow controller 530 may not have the accuracy or precision of the heater, for example, it still may provide an additional variable for adjustment during process operations to control substrate and/or pedestal temperature.

The chambers and systems previously discussed with relation to components described in FIGS. 2A and 5 may be used to perform a number of processes or operations, including controlling a semiconductor processing system pedestal temperature. Turning to FIG. 6 is shown one such method 600 for controlling pedestal temperature. Method 600 may include delivering a temperature controlled fluid to a semiconductor processing system pedestal at operation 610. The fluid may then be used to adjust or maintain a substrate temperature. The method may also include receiving the temperature controlled fluid from the semiconductor processing system pedestal in operation 620. The fluid may be pumped or otherwise flowed through the system utilizing at least one fluid channel, which may house the temperature controlled fluid.

The method may also include measuring the temperature of the received temperature controlled fluid at operation 630. The temperature may be measured with any temperature measurement device, including those described previously, to determine the temperature of the fluid exiting the pedestal. By measuring the temperature of the return fluid in this way, the system may account for any temperature effect of the process or operations being performed in the chamber itself. At operation 640, the measured temperature may be communicated to a first temperature control device. The temperature of the temperature controlled fluid may then be adjusted in operation 650.

A temperature measurement device may communicate the received temperature directly to the first temperature control device, or may provide it to a separate controller for comparison to a set point and regulation of the first temperature control device. By operating the system in a feedback method, improved accuracy and precision can be afforded to the actual pedestal temperature, providing almost if not real-time control of the pedestal and substrate temperature. The first temperature control device may have high precision and allow for fine tune adjustment of temperature such as changes of less than or about 1° C., 0.8° C., 0.6° C., 0.5° C., 0.4° C., 0.3° C., 0.2° C., 0.1° C., etc. or less. In this way, if the temperature measurement device measures a temperature above the set point of the system, the first temperature control device can reduce the temperature accordingly to maintain the set point.

A second temperature control device may also be used within the system and method, and may be in fluid communication with the first temperature control device in embodiments, and may be any of the temperature control devices previously described to deliver the temperature controlled fluid to the pedestal. In embodiments, the first temperature control device and second temperature control device may be coupled in series to deliver the temperature controlled fluid to the pedestal. The two temperature control devices may operate in similar or in different ways, for example, and in embodiments the first temperature control device may heat the temperature controlled fluid while the second temperature control device may cool the temperature controlled fluid. Reverse or alternative setups may also be utilized and are similarly encompassed in the present technology.

In embodiments, the temperature of the temperature controlled fluid may be set by operation of both the first temperature control device and the second temperature control device. One or both of these devices may by utilized in the adjusting operation, and in one example, the adjusting operation may be performed by the first temperature control device.

Without wishing to limit the present technology, an example of operation is here provided, although it is to be understood that many other operational situations may be realized by the present system and methods. In the embodiment, for example, a pedestal or substrate set point of 15° C. may be desired for the processes being performed on or to the substrate. The example may utilize the system configuration of FIG. 5, although it is to be understood that modules or components within the system may be in different order for embodiments. This configuration may utilize both a chiller, such as chiller 520, as well as a heater, such as heater 515. The heater may have better accuracy and/or precision than the chiller, for example, and thus may be used to adjust the temperature via feedback from a temperature measurement device, such as device 525.

The chiller may operate to provide the temperature controlled fluid at a temperature of 10° C., for example, and the heater may then heat the temperature controlled fluid to a temperature of 15° C. to be delivered to the pedestal. It is to be understood that either component may be used to provide any degree or amount of the temperature adjustment, and the above description is for example purposes only. A first operation may be performed on the substrate, and the temperature measurement device may record the exiting temperatures to determine that the pedestal and/or substrate are being maintained at 15° C. Other operations performed within the chamber may include generating a plasma, which will additionally produce heat, or may include having additional components in the system at a temperature other than 15° C., which can affect the pedestal temperature.

For example, a plasma may be generated at some point during the operation of the system, which produces a heat load that can affect the pedestal and/or substrate temperature. This may then be translated to the temperature controlled fluid, which may then be read at the temperature measurement device as above 15° C. This reading may be communicated to the heater 515, which may then reduce power, for example, reducing the amount of heat provided to the temperature controlled fluid. The temperature of the temperature controlled fluid may be adjusted in this way to compensate for the heat load provided in the system. Such a feedback design may allow almost real-time feedback and adjustment to minimize any temperature drift of the system, to maintain the substrate and/or pedestal temperature at all times within about or less than 1° C., 0.8° C., 0.6° C., 0.5° C., 0.4° C., 0.3° C., 0.2° C., 0.1° C., etc. or less.

Continuing the example, if the plasma is stopped, the heat load on the substrate and/or pedestal may then be reduced, which will then be translated to the temperature controlled fluid, and measured by the temperature measurement device. This can then be communicated directly to the heater, which may then raise the temperature accordingly to maintain the set point. Such an operation may minimize or eliminate temperature drift that may otherwise occur in conventional systems, which may include a delay in recognizing a change in temperature, as well as a delay in adjusting the temperature accordingly. Additionally, the technology can provide consistent temperature control between chambers without the variable of contact with the pedestal to limit the accuracy. Any number of other scenarios may be appreciated from this design, all of which are encompassed by the described technology.

In the preceding description, for the purposes of explanation, numerous details have been set forth in order to provide an understanding of various embodiments of the present technology. It will be apparent to one skilled in the art, however, that certain embodiments may be practiced without some of these details, or with additional details.

Having disclosed several embodiments, it will be recognized by those of skill in the art that various modifications, alternative constructions, and equivalents may be used without departing from the spirit of the embodiments. Additionally, a number of well-known processes and elements have not been described in order to avoid unnecessarily obscuring the present technology. Accordingly, the above description should not be taken as limiting the scope of the technology. Additionally, methods or processes may be described as sequential or in steps, but it is to be understood that the operations may be performed concurrently, or in different orders than listed.

Where a range of values is provided, it is understood that each intervening value, to the smallest fraction of the unit of the lower limit, unless the context clearly dictates otherwise, between the upper and lower limits of that range is also specifically disclosed. Any narrower range between any stated values or unstated intervening values in a stated range and any other stated or intervening value in that stated range is encompassed. The upper and lower limits of those smaller ranges may independently be included or excluded in the range, and each range where either, neither, or both limits are included in the smaller ranges is also encompassed within the technology, subject to any specifically excluded limit in the stated range. Where the stated range includes one or both of the limits, ranges excluding either or both of those included limits are also included.

As used herein and in the appended claims, the singular forms “a”, “an”, and “the” include plural references unless the context clearly dictates otherwise. Thus, for example, reference to “an aperture” includes a plurality of such apertures, and reference to “the heater” includes reference to one or more heaters and equivalents thereof known to those skilled in the art, and so forth.

Also, the words “comprise(s)”, “comprising”, “contain(s)”, “containing”, “include(s)”, and “including”, when used in this specification and in the following claims, are intended to specify the presence of stated features, integers, components, or operations, but they do not preclude the presence or addition of one or more other features, integers, components, operations, acts, or groups. 

The invention claimed is:
 1. A semiconductor processing system comprising: a substrate pedestal; a delivery fluid channel configured to deliver a temperature controlled fluid to the substrate pedestal; a return fluid channel configured to return the temperature controlled fluid from the substrate pedestal; a cooling device coupled with the return fluid channel and the delivery fluid channel, wherein the cooling device is configured to cool fluid received from the return fluid channel and deliver the cooled fluid to the delivery fluid channel; a heater coupled with the delivery fluid channel, wherein the heater is configured to have a response time per 1° C. of less than 5 seconds from receipt of a communication from the temperature measurement device; a temperature measurement device coupled with the return fluid channel between the substrate pedestal and the cooling device, wherein the temperature measurement device is communicatively coupled to the heater providing temperature readings directly to the heater; and a flow controller coupled with the return fluid channel upstream of the temperature measurement device.
 2. The semiconductor processing system of claim 1, wherein the temperature measurement device is coupled with the return fluid channel to directly contact a fluid flowed through the return fluid channel.
 3. The semiconductor processing system of claim 2, wherein the temperature controlled fluid comprises at least one of water, glycol, or a refrigerant.
 4. The semiconductor processing system of claim 3, wherein the fluid comprises a mixture of water and ethylene glycol.
 5. The semiconductor processing system of claim 1, wherein the cooling device comprises a chiller or a heat exchanger.
 6. The semiconductor processing system of claim 1, wherein the system is configured to maintain a temperature of the pedestal below about 100° C.
 7. The semiconductor processing system of claim 1, wherein the system is configured to maintain a temperature variation of the pedestal below about 3° C.
 8. The semiconductor processing system of claim 1, wherein the flow controller comprises a pump or valve.
 9. The semiconductor processing system of claim 1, wherein the temperature measurement device is directly coupled with the heater.
 10. A semiconductor processing substrate pedestal system comprising: a substrate support pedestal; a cooling apparatus; at least one delivery fluid channel providing fluid communication between the cooling apparatus and the substrate support pedestal; at least one return fluid channel providing fluid communication between the substrate support pedestal and the cooling apparatus; a heating apparatus coupled with the at least one delivery fluid channel; a temperature measurement device coupled with the at least one return fluid channel and configured to measure a fluid temp within the return fluid channel, wherein the temperature measurement device is communicatively coupled directly to the heating apparatus; and a flow controller coupled with the at least one return fluid channel upstream of the temperature measurement device. 